مؤتمر
Total dose hardness of three commercial CMOS microelectronics foundries
العنوان: | Total dose hardness of three commercial CMOS microelectronics foundries |
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المؤلفون: | Osborn, J.V., Lacoe, R.C., Mayer, D.C., Yabiku, G. |
المصدر: | RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294) Radiation and its effects on components and systems (RADECS) Radiation and Its Effects on Components and Systems, 1997. RADECS 97. Fourth European Conference on. :265-270 1997 |
Relation: | RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294) |
قاعدة البيانات: | IEEE Xplore Digital Library |
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