مؤتمر
Metric learning using labeled and unlabeled data for semi-supervised/domain adaptation classification
العنوان: | Metric learning using labeled and unlabeled data for semi-supervised/domain adaptation classification |
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المؤلفون: | Benisty, Hadas, Crammer, Koby |
المصدر: | 2014 IEEE 28th Convention of Electrical & Electronics Engineers in Israel (IEEEI) Electrical & Electronics Engineers in Israel (IEEEI), 2014 IEEE 28th Convention of. :1-5 Dec, 2014 |
Relation: | 2014 IEEE 28th Convention of Electrical & Electronics Engineers in Israel (IEEEI) |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9781479959877 9781479959884 |
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DOI: | 10.1109/EEEI.2014.7005770 |