مؤتمر
Survey of recent advanced statistical models for early life failure probability assessment in semiconductor manufacturing
العنوان: | Survey of recent advanced statistical models for early life failure probability assessment in semiconductor manufacturing |
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المؤلفون: | Kurz, Daniel, Lewitschnig, Horst, Pilz, Jurgen |
المصدر: | Proceedings of the Winter Simulation Conference 2014 Simulation Conference (WSC), 2014 Winter. :2600-2608 Dec, 2014 |
Relation: | 2014 Winter Simulation Conference - (WSC 2014) |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9781479974849 9781479974863 |
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تدمد: | 08917736 15584305 |
DOI: | 10.1109/WSC.2014.7020104 |