التفاصيل البيبلوغرافية
| العنوان: |
Sub-22nm scaling of UTB2SOI devices for Multi-Vt applications |
| المؤلفون: |
Diaz-Llorente, C., Medina-Bailon, C., Sampedro, C., Gamiz, F., Godoy, A., Donetti, L. |
| المصدر: |
EUROSOI-ULIS 2015: 2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon Ultimate Integration on Silicon (EUROSOI-ULIS), 2015 Joint International EUROSOI Workshop and International Conference on. :281-284 Jan, 2015 |
| Relation: |
2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
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