التفاصيل البيبلوغرافية
| العنوان: |
STT-MRAM cell reliability evaluation under process, voltage and temperature (PVT) variations |
| المؤلفون: |
Vatajelu, Elena I., Rodriguez-Montanes, Rosa, Indaco, Marco, Prinetto, Paolo, Figueras, Joan |
| المصدر: |
2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) Design & Technology of Integrated Systems in Nanoscale Era (DTIS), 2015 10th International Conference on. :1-6 Apr, 2015 |
| Relation: |
2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
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