مؤتمر
Off chip monitors and built in current sensors for analogue and mixed signal testing
| العنوان: | Off chip monitors and built in current sensors for analogue and mixed signal testing |
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| المؤلفون: | Maidon, Y., Deval, Y., Manhaeve, H. |
| المصدر: | Proceedings 1998 IEEE International Workshop on IDDQ Testing (Cat. No.98EX232) IDDQ testing IDDQ Testing, 1998. Proceedings. 1998 IEEE International Workshop on. :59-63 1998 |
| Relation: | Proceedings 1998 IEEE International Workshop on IDDQ Testing |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0818691913 9780818691911 |
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| DOI: | 10.1109/IDDQ.1998.730758 |