مؤتمر
Total-dose radiation tolerance of a commercial 0.35 /spl mu/m CMOS process
| العنوان: | Total-dose radiation tolerance of a commercial 0.35 /spl mu/m CMOS process |
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| المؤلفون: | Lacoe, R.C., Osborn, J.V., Mayer, D.C., Brown, S., Hunt, D.R. |
| المصدر: | 1998 IEEE Radiation Effects Data Workshop. NSREC 98. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.98TH8385) Radiation effects data workshop Radiation Effects Data Workshop, 1998. IEEE. :104-110 1998 |
| Relation: | 1998 IEEE Radiation Effects Data Workshop. NSREC 98. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference |
| قاعدة البيانات: | IEEE Xplore Digital Library |
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