مؤتمر
SEU sensitivity and modeling using pico-second pulsed laser stimulation of a D Flip-Flop in 40 nm CMOS technology
| العنوان: | SEU sensitivity and modeling using pico-second pulsed laser stimulation of a D Flip-Flop in 40 nm CMOS technology |
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| المؤلفون: | Champeix, Clement, Borrel, Nicolas, Dutertre, Jean-Max, Robisson, Bruno, Lisart, Mathieu, Sarafianos, Alexandre |
| المصدر: | 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS), 2015 IEEE International Symposium on. :177-182 Oct, 2015 |
| Relation: | 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781479986064 9781509003129 |
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| تدمد: | 15505774 23777966 |
| DOI: | 10.1109/DFT.2015.7315158 |