High coverage test for the second generation current conveyor

التفاصيل البيبلوغرافية
العنوان: High coverage test for the second generation current conveyor
المؤلفون: Emara, A. S., Madian, A. H., Amer, H. H., Amer, S. H.
المصدر: 2015 IEEE International Conference on Electronics, Circuits, and Systems (ICECS) Electronics, Circuits, and Systems (ICECS), 2015 IEEE International Conference on. :429-432 Dec, 2015
Relation: 2015 IEEE International Conference on Electronics, Circuits, and Systems (ICECS)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781509002467
9781509002450
DOI:10.1109/ICECS.2015.7440340