مؤتمر
High coverage test for the second generation current conveyor
العنوان: | High coverage test for the second generation current conveyor |
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المؤلفون: | Emara, A. S., Madian, A. H., Amer, H. H., Amer, S. H. |
المصدر: | 2015 IEEE International Conference on Electronics, Circuits, and Systems (ICECS) Electronics, Circuits, and Systems (ICECS), 2015 IEEE International Conference on. :429-432 Dec, 2015 |
Relation: | 2015 IEEE International Conference on Electronics, Circuits, and Systems (ICECS) |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9781509002467 9781509002450 |
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DOI: | 10.1109/ICECS.2015.7440340 |