مؤتمر
Comparison of Two Temporary Carriers for Test and Burn-In of Memory Die
| العنوان: | Comparison of Two Temporary Carriers for Test and Burn-In of Memory Die |
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| المؤلفون: | Lindsey, S., Williams, B., Vasquez, B., Altuna, B., VanOverloop, D., Walker, S. |
| المصدر: | Proceedings of the International Conference on Multichip Modules Multichip Modules, 1994. Proceedings of the 1994 International Conference on. :29-33 1994 |
| Relation: | Proceedings of the International Conference on Multichip Modules |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0930815394 9780930815394 |
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| DOI: | 10.1109/ICMCM.1994.753525 |