Improvement of mim capacitor early breakdown by metal deposition process optimization and ar sputter etch implementation

التفاصيل البيبلوغرافية
العنوان: Improvement of mim capacitor early breakdown by metal deposition process optimization and ar sputter etch implementation
المؤلفون: Yeh, C.-T., Chu, S.-M., Yeh, Y.-H., Ting, W.-C., Lu, C.-Y.
المصدر: 2016 e-Manufacturing and Design Collaboration Symposium (eMDC) e-Manufacturing and Design Collaboration Symposium (eMDC), 2016. :1-4 Sep, 2016
Relation: 2016 e-Manufacturing and Design Collaboration Symposium (eMDC)
قاعدة البيانات: IEEE Xplore Digital Library