دورية أكاديمية
Single-probe traversal optimization for testing of MCM substrate interconnections
| العنوان: | Single-probe traversal optimization for testing of MCM substrate interconnections |
|---|---|
| المؤلفون: | Pendurkar, R., Tovey, C., Chatterjee, A. |
| المصدر: | IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 18(8):1178-1191 Aug, 1999 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 02780070 19374151 |
|---|---|
| DOI: | 10.1109/43.775636 |