مؤتمر
A novel characterization tool for the study of dielectric breakdown of ultra-thin oxide MOS structures
| العنوان: | A novel characterization tool for the study of dielectric breakdown of ultra-thin oxide MOS structures |
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| المؤلفون: | Basso, G., Crupi, F., Neri, B., Giannetti, R., Lombardo, S. |
| المصدر: | IMTC/99. Proceedings of the 16th IEEE Instrumentation and Measurement Technology Conference (Cat. No.99CH36309) Instrumentation and measurement technology Instrumentation and Measurement Technology Conference, 1999. IMTC/99. Proceedings of the 16th IEEE. 3:1923-1926 vol.3 1999 |
| Relation: | IMTC/99. Proceedings of the 16th IEEE Instrumentation and Measurement Technology Conference. Measurements for the New Millennium |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780352769 9780780352766 |
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| تدمد: | 10915281 |
| DOI: | 10.1109/IMTC.1999.776154 |