دورية أكاديمية

Solid-State-Diffusion Bonding for Wafer-Level Fine-Pitch Cu/Sn/Cu Interconnect in 3-D Integration

التفاصيل البيبلوغرافية
العنوان: Solid-State-Diffusion Bonding for Wafer-Level Fine-Pitch Cu/Sn/Cu Interconnect in 3-D Integration
المؤلفون: Wang, J., Wang, Q., Wu, Z., Wang, D., Cai, J.
المصدر: IEEE Transactions on Components, Packaging and Manufacturing Technology IEEE Trans. Compon., Packag. Manufact. Technol. Components, Packaging and Manufacturing Technology, IEEE Transactions on. 7(1):19-26 Jan, 2017
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
تدمد:21563950
21563985
DOI:10.1109/TCPMT.2016.2626794