مؤتمر
Cross-layer system reliability assessment framework for hardware faults
| العنوان: | Cross-layer system reliability assessment framework for hardware faults |
|---|---|
| المؤلفون: | Vallero, A., Savino, A., Politano, G., Di Carlo, S., Chatzidimitriou, A., Tselonis, S., Kaliorakis, M., Gizopoulos, D., Riera, M., Canal, R., Gonzalez, A., Kooli, M., Bosio, A., Di Natale, G. |
| المصدر: | 2016 IEEE International Test Conference (ITC) Test Conference (ITC), 2016 IEEE International. :1-10 Nov, 2016 |
| Relation: | 2016 IEEE International Test Conference (ITC) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
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