مؤتمر
Testing of memristor ratioed logic (MRL) XOR gate
| العنوان: | Testing of memristor ratioed logic (MRL) XOR gate |
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| المؤلفون: | Emara, A. S., Madian, A. H., Amer, H. H., Amer, S. H., Abdelhalim, M. B. |
| المصدر: | 2016 28th International Conference on Microelectronics (ICM) Microelectronics (ICM), 2016 28th International Conference on. :181-184 Dec, 2016 |
| Relation: | 2016 28th International Conference on Microelectronics (ICM) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781509057214 |
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| DOI: | 10.1109/ICM.2016.7847939 |