Simulation of 4H-SiC trench junction barrier Schottky diodes with high-k dielectrics

التفاصيل البيبلوغرافية
العنوان: Simulation of 4H-SiC trench junction barrier Schottky diodes with high-k dielectrics
المؤلفون: Yang, Shuai, Song, Qing Wen, Tang, Xiao Yan, Zhang, Yi Meng, Zhang, Yu Ming, Zhang, Yi Men, Yuan, Hao, Sun, Qiu Jie
المصدر: 2016 European Conference on Silicon Carbide & Related Materials (ECSCRM) Silicon Carbide & Related Materials (ECSCRM), European Conference on. :1-1 Sep, 2016
Relation: 2016 European Conference on Silicon Carbide & Related Materials (ECSCRM)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9783035730432
DOI:10.4028/www.scientific.net/MSF.897.431