مؤتمر
Investigation of HCI effects in FinFET based ring oscillator circuits and IP blocks
| العنوان: | Investigation of HCI effects in FinFET based ring oscillator circuits and IP blocks |
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| المؤلفون: | Kim, Yoohwan, Shim, Hyewon, Jin, Minjung, Bae, Jongsun, Liu, Changze, Pae, Sangwoo |
| المصدر: | 2017 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS),2017 IEEE International. :4C-2.1-4C-2.4 Apr, 2017 |
| Relation: | 2017 IEEE International Reliability Physics Symposium (IRPS) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781509066414 |
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| تدمد: | 19381891 |
| DOI: | 10.1109/IRPS.2017.7936313 |