مؤتمر
New process of the eddy current probe impedance calculation for plate inspection using bidimensional Magnetically Coupled Elements
العنوان: | New process of the eddy current probe impedance calculation for plate inspection using bidimensional Magnetically Coupled Elements |
---|---|
المؤلفون: | Belhamri, A., Hicham, A., Yonnet, J., Chebout, M. |
المصدر: | 2017 IEEE International Magnetics Conference (INTERMAG) Magnetics Conference (INTERMAG), 2017 IEEE International. :1-1 Apr, 2017 |
Relation: | 2017 IEEE International Magnetics Conference (INTERMAG) |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9781538610862 |
---|---|
تدمد: | 21504601 |
DOI: | 10.1109/INTMAG.2017.8007978 |