مؤتمر
New process of the eddy current probe impedance calculation for plate inspection using bidimensional Magnetically Coupled Elements
| العنوان: | New process of the eddy current probe impedance calculation for plate inspection using bidimensional Magnetically Coupled Elements |
|---|---|
| المؤلفون: | Belhamri, A., Hicham, A., Yonnet, J., Chebout, M. |
| المصدر: | 2017 IEEE International Magnetics Conference (INTERMAG) Magnetics Conference (INTERMAG), 2017 IEEE International. :1-1 Apr, 2017 |
| Relation: | 2017 IEEE International Magnetics Conference (INTERMAG) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
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