مؤتمر
An on-chip detector of transient stress events
| العنوان: | An on-chip detector of transient stress events |
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| المؤلفون: | Patnaik, A., Suchak, M., Seva, R., Pamidimukkala, K., Pommerenke, D., Edgington, G., Moseley, R., Feddeler, J., Stockinger, M., Beetner, D. |
| المصدر: | 2017 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI) Electromagnetic Compatibility & Signal/Power Integrity (EMCSI), 2017 IEEE International Symposium on. :146-151 Aug, 2017 |
| Relation: | 2017 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781538622292 9781538622285 9781538622315 9781538622308 |
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| تدمد: | 21581118 |
| DOI: | 10.1109/ISEMC.2017.8077857 |