مؤتمر
Notice of Removal: Shearography using wave-defect interactions for crack detection in metallic structures
| العنوان: | Notice of Removal: Shearography using wave-defect interactions for crack detection in metallic structures |
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| المؤلفون: | Liu, Huajun, Guo, Shifeng, Chen, Yi Fan, Liu, Hongwei, Tan, Chin Yaw, Ke, Karen Lin, Zhang, Lei |
| المصدر: | 2017 IEEE International Ultrasonics Symposium (IUS) Ultrasonics Symposium (IUS), 2017 IEEE International. :1-1 Sep, 2017 |
| Relation: | 2017 IEEE International Ultrasonics Symposium (IUS) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781538633830 9781538633823 |
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| تدمد: | 19485727 |
| DOI: | 10.1109/ULTSYM.2017.8092815 |