مؤتمر
Profiling border-traps by TCAD analysis of multifrequency CV-curves in Al2O3/InGaAs stacks
| العنوان: | Profiling border-traps by TCAD analysis of multifrequency CV-curves in Al2O3/InGaAs stacks |
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| المؤلفون: | Caruso, E., Lin, J., Burke, K. F., Cherkaoui, K., Esseni, D., Gity, F., Monaghan, S., Palestri, P., Hurley, P., Selmi, L. |
| المصدر: | 2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) Ultimate Integration on Silicon (EUROSOI-ULIS), 2018 Joint International EUROSOI Workshop and International Conference on. :1-4 Mar, 2018 |
| Relation: | 2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781538648117 9781538648100 |
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| تدمد: | 24729132 |
| DOI: | 10.1109/ULIS.2018.8354757 |