التفاصيل البيبلوغرافية
| العنوان: |
Study of Biased Temperature Instabilities in LDMOST technologies |
| المؤلفون: |
Tao, Guoqiao, Koster, R., Romanescu, A., Theeuwen, S., van Dalen, R., Bosch, H., Wang, Tsung-Miau, Chen, Shih-Yuan, Jhuang, Yu-Fei, Cheng, Yung-Wen |
| المصدر: |
2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2018 IEEE International Symposium on the. :1-4 Jul, 2018 |
| Relation: |
2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
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