A Capture Safe Static Test Compaction Method Based on Don't Cares

التفاصيل البيبلوغرافية
العنوان: A Capture Safe Static Test Compaction Method Based on Don't Cares
المؤلفون: Ochi, Sayuri, Yamazaki, Hiroshi, Hosokawa, Toshinori, Yoshimura, Masayoshi
المصدر: 2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS) On-Line Testing And Robust System Design (IOLTS), 2018 IEEE 24th International Symposium on. :195-200 Jul, 2018
Relation: 2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781538659922
9781538659915
تدمد:19429401
DOI:10.1109/IOLTS.2018.8474080