مؤتمر
Characterization of interfaces involving electrically conductive adhesives using electron-beam moire and infrared microscopy
العنوان: | Characterization of interfaces involving electrically conductive adhesives using electron-beam moire and infrared microscopy |
---|---|
المؤلفون: | Slifka, A.J., Drexler, E.S. |
المصدر: | 2000 Proceedings. 50th Electronic Components and Technology Conference (Cat. No.00CH37070) Electronic components and technology Electronic Components & Technology Conference, 2000. 2000 Proceedings. 50th. :403-407 2000 |
Relation: | 2000 Proceedings. 50th Electronic Components and Technology Conference |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 0780359089 9780780359086 |
---|---|
DOI: | 10.1109/ECTC.2000.853185 |