Modelling on Aging Induced Time Dependent Variability of Z2FET for Memory Applications

التفاصيل البيبلوغرافية
العنوان: Modelling on Aging Induced Time Dependent Variability of Z2FET for Memory Applications
المؤلفون: Duan, M., Cheng, B., Bailon, C. Medina, Adamu-Lema, F, Asenov, P., Millar, C., Pfaeffli, P., Asenov, A.
المصدر: 2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) Simulation of Semiconductor Processes and Devices (SISPAD), 2018 International Conference on. :119-122 Sep, 2018
Relation: 2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781538667903
تدمد:19461577
DOI:10.1109/SISPAD.2018.8551718