مؤتمر
Investigation of single-ion multiple-bit upsets in memories on board a space experiment
| العنوان: | Investigation of single-ion multiple-bit upsets in memories on board a space experiment |
|---|---|
| المؤلفون: | Buchner, S., Campbell, A.B., Meehan, T., Clark, K.A., McMorrow, D., Dyer, C., Sanderson, C., Comber, C., Kuboyama, S. |
| المصدر: | 1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471) Radiation and its effects on components and systems Radiation and Its Effects on Components and Systems, 1999. RADECS 99. 1999 Fifth European Conference on. :558-564 1999 |
| Relation: | 1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780357264 9780780357266 |
|---|---|
| DOI: | 10.1109/RADECS.1999.858647 |