Evaluation of Microscopic Strain Distribution of Low-Temperature Sintering Die Attach in Thermal Cycling Test

التفاصيل البيبلوغرافية
العنوان: Evaluation of Microscopic Strain Distribution of Low-Temperature Sintering Die Attach in Thermal Cycling Test
المؤلفون: Suzuki, Tomohisa, Yasuda, Yusuke, Terasaki, Takeshi, Morita, Toshiaki, Kawana, Yuki, Ishikawa, Dai, Nishimura, Masato, Nakako, Hideo, Kurafuchi, Kazuhiko, Matsuda, Tetsuya
المصدر: 2018 20th International Conference on Electronic Materials and Packaging (EMAP) Electronic Materials and Packaging (EMAP), 2018 20th International Conference on. :1-4 Dec, 2018
Relation: 2018 20th International Conference on Electronic Materials and Packaging (EMAP)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781538656426
DOI:10.1109/EMAP.2018.8660822