Test and evaluation of chip-to-chip attachment of MEMS devices

التفاصيل البيبلوغرافية
العنوان: Test and evaluation of chip-to-chip attachment of MEMS devices
المؤلفون: Sandborn, P., Swaminathan, R., Subramanian, G., Deeds, M., Cochran, K.
المصدر: ITHERM 2000. The Seventh Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (Cat. No.00CH37069) Thermal and thermomechanical phenomena in electronic systems Thermal and Thermomechanical Phenomena in Electronic Systems, 2000. ITHERM 2000. The Seventh Intersociety Conference on. 1:133-140 2000
Relation: ITHERM 2000. The Seventh Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems
قاعدة البيانات: IEEE Xplore Digital Library