مؤتمر
600 Mrad TID effects on a new generation high rate Pixel Readout ASIC in 65nm CMOS with low-power, low noise synchronous analog front-end using Fast ToT encodingand auto-zeroing
| العنوان: | 600 Mrad TID effects on a new generation high rate Pixel Readout ASIC in 65nm CMOS with low-power, low noise synchronous analog front-end using Fast ToT encodingand auto-zeroing |
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| المؤلفون: | Monteil, Ennio, Demaria, Natale, Pacher, Luca, Rivetti, Angelo, Rolo, Manuel Dionisio Da Rocha, Wheadon, Richard, Paterno, Andrea, Panati, Serena |
| المصدر: | 2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Radiation and Its Effects on Components and Systems (RADECS), 2017 17th European Conference on. :1-5 Oct, 2017 |
| Relation: | 2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781538612613 9781538612606 |
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| تدمد: | 16090438 |
| DOI: | 10.1109/RADECS.2017.8696141 |