مؤتمر
Hot Carrier Reliability Improvement of Thicker Gate Oxide nFET Devices in Advanced FinFETs
العنوان: | Hot Carrier Reliability Improvement of Thicker Gate Oxide nFET Devices in Advanced FinFETs |
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المؤلفون: | Mahmud, M. Iqbal, Gupta, A., Toledano-Luque, M., Mavilla, N., Johnson, J., Srinivasan, P., Zainuddin, A., Rao, S., Cimino, S., Min, B., Nigam, T. |
المصدر: | 2019 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2019 IEEE International. :1-6 Mar, 2019 |
Relation: | 2019 IEEE International Reliability Physics Symposium (IRPS) |
قاعدة البيانات: | IEEE Xplore Digital Library |
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