مؤتمر
New categories of Safe Faults in a processor-based Embedded System
| العنوان: | New categories of Safe Faults in a processor-based Embedded System |
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| المؤلفون: | Gursoy, C., Jenihhin, M., Oyeniran, A. S., Piumatti, D., Raik, J., Reorda, M. Sonza, Ubar, R. |
| المصدر: | 2019 IEEE 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2019 IEEE 22nd International Symposium on. :1-4 Apr, 2019 |
| Relation: | 2019 IEEE 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781728100739 9781728100722 |
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| تدمد: | 24732117 |
| DOI: | 10.1109/DDECS.2019.8724642 |