مؤتمر
Gate oxide degradation assessment by electrical stress and capacitance measurements
| العنوان: | Gate oxide degradation assessment by electrical stress and capacitance measurements |
|---|---|
| المؤلفون: | Morillon, Dann, Masson, Pascal, Julien, Franck, Lorenzini, Philippe, Goy, Jerome, Pribat, Clement, Gourhant, Olivier, Kempf, Thibault, Ogier, Jean-Luc, Villaret, Alexandre, Ghezzi, Giada, Cherault, Nathalie, Niel, Stephan |
| المصدر: | 2018 International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2018 International. :1-4 Oct, 2018 |
| Relation: | 2018 International Integrated Reliability Workshop (IIRW) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
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