Random Telegraph Noise after Hot Carrier Injection in Tri-gate Nanowire Transistor

التفاصيل البيبلوغرافية
العنوان: Random Telegraph Noise after Hot Carrier Injection in Tri-gate Nanowire Transistor
المؤلفون: Ota, Kensuke, Ichihara, Reika, Suzuki, Masamichi, Saitoh, Masumi, Mitani, Yuichiro
المصدر: 2019 Electron Devices Technology and Manufacturing Conference (EDTM) Electron Devices Technology and Manufacturing Conference (EDTM), 2019. :169-171 Mar, 2019
Relation: 2019 Electron Devices Technology and Manufacturing Conference (EDTM)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781538665084
DOI:10.1109/EDTM.2019.8731025