مؤتمر
Random Telegraph Noise after Hot Carrier Injection in Tri-gate Nanowire Transistor
العنوان: | Random Telegraph Noise after Hot Carrier Injection in Tri-gate Nanowire Transistor |
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المؤلفون: | Ota, Kensuke, Ichihara, Reika, Suzuki, Masamichi, Saitoh, Masumi, Mitani, Yuichiro |
المصدر: | 2019 Electron Devices Technology and Manufacturing Conference (EDTM) Electron Devices Technology and Manufacturing Conference (EDTM), 2019. :169-171 Mar, 2019 |
Relation: | 2019 Electron Devices Technology and Manufacturing Conference (EDTM) |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9781538665084 |
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DOI: | 10.1109/EDTM.2019.8731025 |