مؤتمر
Detecting "0-Day" Vulnerability: An Empirical Study of Secret Security Patch in OSS
| العنوان: | Detecting "0-Day" Vulnerability: An Empirical Study of Secret Security Patch in OSS |
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| المؤلفون: | Wang, Xinda, Sun, Kun, Batcheller, Archer, Jajodia, Sushil |
| المصدر: | 2019 49th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN) DSN Dependable Systems and Networks (DSN), 2019 49th Annual IEEE/IFIP International Conference on. :485-492 Jun, 2019 |
| Relation: | 2019 49th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
| ردمك: | 9781728100579 9781728100562 |
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| DOI: | 10.1109/DSN.2019.00056 |