دورية أكاديمية
Ion-Induced Energy Pulse Mechanism for Single-Event Burnout in High-Voltage SiC Power MOSFETs and Junction Barrier Schottky Diodes
| العنوان: | Ion-Induced Energy Pulse Mechanism for Single-Event Burnout in High-Voltage SiC Power MOSFETs and Junction Barrier Schottky Diodes |
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| المؤلفون: | Ball, D.R., Galloway, K.F., Johnson, R.A., Alles, M.L., Sternberg, A.L., Sierawski, B.D., Witulski, A.F., Reed, R.A., Schrimpf, R.D., Hutson, J.M., Javanainen, A., Lauenstein, J. |
| المصدر: | IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 67(1):22-28 Jan, 2020 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 00189499 15581578 |
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| DOI: | 10.1109/TNS.2019.2955922 |