Inherent MEMS sensor array variability reduction using robust regression

التفاصيل البيبلوغرافية
العنوان: Inherent MEMS sensor array variability reduction using robust regression
المؤلفون: Gawande, Tushar, Deshmukh, Raghavendra, Patrika, Rajendra, Deshmukh, Sharvari
المصدر: 2019 IEEE Bombay Section Signature Conference (IBSSC) Bombay Section Signature Conference (IBSSC), 2019 IEEE. :1-4 Jul, 2019
Relation: 2019 IEEE Bombay Section Signature Conference (IBSSC)
قاعدة البيانات: IEEE Xplore Digital Library