مؤتمر
Performance Gap Between Valid and Invalid Patents in Six Technology Fields
العنوان: | Performance Gap Between Valid and Invalid Patents in Six Technology Fields |
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المؤلفون: | Dong, Huei-Ru, Chen, Dar-Zen, Huang, Mu-Hsuan |
المصدر: | 2019 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM) Industrial Engineering and Engineering Management (IEEM), 2019 IEEE International Conference on. :1058-1061 Dec, 2019 |
Relation: | 2019 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM) |
قاعدة البيانات: | IEEE Xplore Digital Library |
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