Performance Gap Between Valid and Invalid Patents in Six Technology Fields

التفاصيل البيبلوغرافية
العنوان: Performance Gap Between Valid and Invalid Patents in Six Technology Fields
المؤلفون: Dong, Huei-Ru, Chen, Dar-Zen, Huang, Mu-Hsuan
المصدر: 2019 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM) Industrial Engineering and Engineering Management (IEEM), 2019 IEEE International Conference on. :1058-1061 Dec, 2019
Relation: 2019 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)
قاعدة البيانات: IEEE Xplore Digital Library