التفاصيل البيبلوغرافية
| العنوان: |
22nm STT-MRAM for Reflow and Automotive Uses with High Yield, Reliability, and Magnetic Immunity and with Performance and Shielding Options |
| المؤلفون: |
Gallagher, W.J., Chien, Eric, Chiang, Tien-Wei, Huang, Jian-Cheng, Shih, Meng-Chun, Wang, C.Y., Weng, Chih-Hui, Chen, Sean, Bair, Christine, Lee, George, Shih, Yi-Chun, Lee, Chia-Fu, Lee, Po-Hao, Wang, Roger, Shen, Kuei- Hung, Wu, J. J., Wang, Wayne, Chuang, Harry |
| المصدر: |
2019 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2019 IEEE International. :2.7.1-2.7.4 Dec, 2019 |
| Relation: |
2019 IEEE International Electron Devices Meeting (IEDM) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
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