مؤتمر
Bias-Induced Threshold Voltage Instability and Interface Trap Density Extraction of 4H-SiC MOSFETs
| العنوان: | Bias-Induced Threshold Voltage Instability and Interface Trap Density Extraction of 4H-SiC MOSFETs |
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| المؤلفون: | Yu, Susanna, Kang, Minseok, Liu, Tianshi, Xing, Diang, Salemi, Arash, White, Marvin H., Agarwal, Anant K. |
| المصدر: | 2019 IEEE 7th Workshop on Wide Bandgap Power Devices and Applications (WiPDA) Wide Bandgap Power Devices and Applications (WiPDA), 2019 IEEE 7th Workshop on. :420-424 Oct, 2019 |
| Relation: | 2019 IEEE 7th Workshop on Wide Bandgap Power Devices and Applications (WiPDA) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
| ردمك: | 9781728137612 9781728137605 |
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| DOI: | 10.1109/WiPDA46397.2019.8998931 |