Body Diode Reliability of Commercial SiC Power MOSFETs

التفاصيل البيبلوغرافية
العنوان: Body Diode Reliability of Commercial SiC Power MOSFETs
المؤلفون: Kang, Minseok, Yu, Susanna, Xing, Diang, Liu, Tianshi, Salemi, Arash, Booth, Kristen, Zhu, Shengnan, White, Marvin H., Agarwal, Anant K.
المصدر: 2019 IEEE 7th Workshop on Wide Bandgap Power Devices and Applications (WiPDA) Wide Bandgap Power Devices and Applications (WiPDA), 2019 IEEE 7th Workshop on. :416-419 Oct, 2019
Relation: 2019 IEEE 7th Workshop on Wide Bandgap Power Devices and Applications (WiPDA)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781728137612
9781728137605
DOI:10.1109/WiPDA46397.2019.8998940