مؤتمر
Defect localization using physical design and electrical test information
| العنوان: | Defect localization using physical design and electrical test information |
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| المؤلفون: | Stanojevic, Z., Balachandran, H., Walker, D.M.H., Lakhani, F., Jandhyala, S. |
| المصدر: | 2000 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop. ASMC 2000 (Cat. No.00CH37072) Advanced semiconductor manufacturing Advanced Semiconductor Manufacturing Conference and Workshop, 2000 IEEE/SEMI. :108-115 2000 |
| Relation: | 2000 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780359216 9780780359215 |
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| تدمد: | 10788743 |
| DOI: | 10.1109/ASMC.2000.902568 |