دورية أكاديمية
Variability-Aware Predictive Modeling of Line-to-Line Dielectric Reliability
| العنوان: | Variability-Aware Predictive Modeling of Line-to-Line Dielectric Reliability |
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| المؤلفون: | Ciofi, I., Roussel, P.J., Wilson, C.J., Croes, K. |
| المصدر: | IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 67(4):1737-1744 Apr, 2020 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 00189383 15579646 |
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| DOI: | 10.1109/TED.2020.2975677 |