A Study on the Mechanical Debonding Process through Static-Elastic Stress Analysis for 3-D Wafer Level Packages (WLPs)

التفاصيل البيبلوغرافية
العنوان: A Study on the Mechanical Debonding Process through Static-Elastic Stress Analysis for 3-D Wafer Level Packages (WLPs)
المؤلفون: Lee, Hyeong-Gi, Kim, Dae-Sung, Cho, Jung-Hyun, Lee, Jung-Hyuk, Park, Jae-Yong, Kim, Min-Ho, Lee, Jae-Wook
المصدر: 2020 IEEE 70th Electronic Components and Technology Conference (ECTC) Electronic Components and Technology Conference (ECTC), 2020 IEEE 70th. :303-308 Jun, 2020
Relation: 2020 IEEE 70th Electronic Components and Technology Conference (ECTC)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781728161808
تدمد:23775726
DOI:10.1109/ECTC32862.2020.00364