دورية أكاديمية
Analysis of High-Frequency Measurement of Transistors Along With Electromagnetic and SPICE Cosimulation
| العنوان: | Analysis of High-Frequency Measurement of Transistors Along With Electromagnetic and SPICE Cosimulation |
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| المؤلفون: | Fregonese, S., Cabbia, M., Yadav, C., Deng, M., Panda, S.R., De Matos, M., Celi, D., Chakravorty, A., Zimmer, T. |
| المصدر: | IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 67(11):4770-4776 Nov, 2020 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 00189383 15579646 |
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| DOI: | 10.1109/TED.2020.3022603 |