مؤتمر
Slow Turn-Off Optimization of CMOS ESD NAND Clamp to Eliminate Fly-Back Damage During Unlatch
| العنوان: | Slow Turn-Off Optimization of CMOS ESD NAND Clamp to Eliminate Fly-Back Damage During Unlatch |
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| المؤلفون: | Acharya, Divya, Peachey, Nathaniel, Franck, Stephen, Ruiz-Linares, Emilio, Liu, Jian |
| المصدر: | 2020 42nd Annual EOS/ESD Symposium (EOS/ESD) EOS/ESD Symposium (EOS/ESD), 2020 42nd Annual. :1-5 Sep, 2020 |
| Relation: | 2020 42nd Annual EOS/ESD Symposium (EOS/ESD) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
| ردمك: | 9781728194615 |
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