مؤتمر
Reliability Demonstration of Reflow Qualified 22nm STT-MRAM for Embedded Memory Applications
| العنوان: | Reliability Demonstration of Reflow Qualified 22nm STT-MRAM for Embedded Memory Applications |
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| المؤلفون: | Wang, Chia-Yu, Shih, Meng-Chun, Weng, Chih-Hui, Chen, Chia-Hsiang, Chang, Chih-Yang, Wang, Wayne, Chiang, Tien-Wei, Hung, Arthur, Chuang, Harry, Gallagher, William J. |
| المصدر: | 2020 IEEE Symposium on VLSI Technology VLSI Technology, 2020 IEEE Symposium on. :1-2 Jun, 2020 |
| Relation: | 2020 IEEE Symposium on VLSI Technology |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781728164601 |
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| تدمد: | 21589682 |
| DOI: | 10.1109/VLSITechnology18217.2020.9265054 |