مؤتمر
A new method for measuring the coupling coefficient of a split-gate flash EEPROM without an additional test structure
| العنوان: | A new method for measuring the coupling coefficient of a split-gate flash EEPROM without an additional test structure |
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| المؤلفون: | Fujiwara, H., Arimoto, M., Kaida, T., Sudo, S., Kurooka, K., Nagasawa, H., Hiroshima, T., Mameno, K. |
| المصدر: | ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures (Cat. No.01CH37153) Microelectronic test structures Microelectronic Test Structures, 2001. ICMTS 2001. Proceedings of the 2001 International Conference on. :43-46 2001 |
| Relation: | ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780365119 9780780365117 |
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| DOI: | 10.1109/ICMTS.2001.928635 |