التفاصيل البيبلوغرافية
العنوان: |
An Advanced Ageing Methodology for Robustness Assessment of Normally-off AlGaN/GaN HEMT |
المؤلفون: |
Albany, F., Curutchet, A., Labat, N., Lecourt, F., Walasiak, E., Maher, H., Cordier, Y., Defrance, N., Malbert, N. |
المصدر: |
2020 15th European Microwave Integrated Circuits Conference (EuMIC) Microwave Integrated Circuits Conference (EuMIC), 2020 15th European. :237-240 Jan, 2021 |
Relation: |
2020 15th European Microwave Integrated Circuits Conference (EuMIC) |
قاعدة البيانات: |
IEEE Xplore Digital Library |